NARROW BAND REFLECTANCE MEASUREMENTS CAN BE USED TO ESTIMATE LEAF AREA INDEX, FLOWER NUMBER, FRUIT SET AND BERRY YIELD OF THE WILD BLUEBERRY (VACCINIUM ANGUSTIFOLIUM AIT.)
The feasibility of using visible and near infrared hyperspectral reflectance measurements to estimate vegetative and reproductive yield components of wild blueberries (Vaccinium angustifolium Ait.) was examined in 2007. A completely randomized experimental design was used at two commercial fields with three sampling intervals (anthesis, fruit set and berry harvest), four treatments and three replications per site. Optimum multiple narrow band reflectance (OMNBR) indices were developed for the parameters leaf area index, flower number, fruit set and berry yield. Anthesis was the best sampling interval to estimate leaf area index, flower number and leaf area index with the OMNBR reflectance models having coefficient of determination (R2) values of 0.90, 0.90 and 0.88 respectively. At fruit set, berry number was accurately estimated with the OMNBR reflectance model having a R2 value of 0.79, and just prior to berry harvest berry yield was accurately estimated with the OMNBR reflectance model having a R2 value of 0.79. Therefore, results from this study indicated that narrow band reflectance measurements can be used to estimate vegetative and reproductive parameters in wild blueberry fields. When measured on a geospatial basis, these parameters will be important compo-nents of precision agriculture practices for wild blueberry production.
Percival, D.C., Sharpe , S., Maqbool, R. and Zaman, Q. (2012). NARROW BAND REFLECTANCE MEASUREMENTS CAN BE USED TO ESTIMATE LEAF AREA INDEX, FLOWER NUMBER, FRUIT SET AND BERRY YIELD OF THE WILD BLUEBERRY (VACCINIUM ANGUSTIFOLIUM AIT.). Acta Hortic. 926, 363-369
remote sensing, canopy quantification, leaf area index, yield potential, harvestable berry yield